This month BIPM (the organization that manages SI units) has released a new version. This version replaces the measurement standards that are based upon “artifacts” with standards based upon known constants. The artifacts have been observed to change over certain periods of time and, as a result, can not be trusted as a standard for precision measurements. Moving away from artifact-based standards to universal constants is a fundamental shift in metrology. This may have much more impact at the nano-scale and quantum levels than at the macro-scale; however, I am wondering how this might make it easier for corporations to reach Six Sigma–reducing variation in systems to 3.4 defects per million opportunities? Removing variability from the measurement standards should ultimately make the Six Sigma goal a little easier to reach…
The brochure describing the SI units can be downloaded at BIPM. There are versions in English and French.
